Synchrotron X-ray study of electromigration, whisker growth, and residual strain evolution in a Sn Blech structure
| Autor: | Lee, Pei-Tzu, Hsieh, Wan-Zhen, Lee, Cheng-Yu, Tseng, Shao-Chin, Tang, Mau-Tsu, Chiang, Ching-Yu, Kao, C.R., Ho, Cheng-En |
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| Zdroj: | In Scripta Materialia June 2022 214 |
| Databáze: | ScienceDirect |
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