Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD
Autor: | Ernould, Clément a, b, Beausir, Benoît a, b, Fundenberger, Jean-Jacques a, b, Taupin, Vincent a, b, Bouzy, Emmanuel a, b, ⁎ |
---|---|
Zdroj: | In Scripta Materialia August 2020 185:30-35 |
Databáze: | ScienceDirect |
Externí odkaz: |