Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD

Autor: Ernould, Clément a, b, Beausir, Benoît a, b, Fundenberger, Jean-Jacques a, b, Taupin, Vincent a, b, Bouzy, Emmanuel a, b, ⁎
Zdroj: In Scripta Materialia August 2020 185:30-35
Databáze: ScienceDirect