Determination of sample surface topography using electron back-scatter diffraction patterns
| Autor: | Chapman, M., Callahan, P.G., De Graef, M. |
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| Zdroj: | In Scripta Materialia 15 July 2016 120:23-26 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Chapman, M., Callahan, P.G., De Graef, M. |
|---|---|
| Zdroj: | In Scripta Materialia 15 July 2016 120:23-26 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect