In situ stress relaxation and diffraction studies across the metal–insulator transition in epitaxial and polycrystalline SmNiO3 thin films

Autor: Viswanath, B., Aydogdu, G.H., Ha, S.D., Ramanathan, S.
Zdroj: In Scripta Materialia April 2012 66(7):463-466
Databáze: ScienceDirect