Surface characterization of aqueous washed silicon nitride powders by TPDMS and isoelectric point measurement
Autor: | Ishizaki, Ch, Nakamatsu, T, Kusumi, T ∗, Ishizaki, K |
---|---|
Zdroj: | In Scripta Materialia 18 May 2001 44(8-9):2347-2351 |
Databáze: | ScienceDirect |
Externí odkaz: |