Origin of the retention loss in ferroelectric Hf0.5Zr0.5O2-based memory devices
Autor: | Chouprik, Anastasia, Kondratyuk, Ekaterina, Mikheev, Vitalii, Matveyev, Yury, Spiridonov, Maxim, Chernikova, Anna, Kozodaev, Maxim G., Markeev, Andrey M., Zenkevich, Andrei, Negrov, Dmitrii |
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Zdroj: | In Acta Materialia 1 February 2021 204 |
Databáze: | ScienceDirect |
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