Identification of whisker grain in Sn coatings by analyzing crystallographic micro-texture using electron back-scatter diffraction
| Autor: | Jagtap, Piyush, Chakraborty, Aritra, Eisenlohr, Philip, Kumar, Praveen |
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| Zdroj: | In Acta Materialia 1 August 2017 134:346-359 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect