Mono-like silicon ingots grown on low angle misoriented seeds: Defect characterization by synchrotron X-ray diffraction imaging
| Autor: | Tsoutsouva, M.G., Oliveira, V.A., Camel, D., Baruchel, J., Marie, B., Lafford, T.A. |
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| Zdroj: | In Acta Materialia 15 April 2015 88:112-120 |
| Databáze: | ScienceDirect |
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