Comparison of crystal orientation mapping-based and image-based measurement of grain size and grain size distribution in a thin aluminum film

Autor: Liu, Xuan, Warren, Andrew P., Nuhfer, Noel T., Rollett, Anthony D., Coffey, Kevin R., Barmak, Katayun
Zdroj: In Acta Materialia 15 October 2014 79:138-145
Databáze: ScienceDirect