Small-angle subgrain boundaries emanating from dislocation pile-ups in multicrystalline silicon studied with synchrotron white-beam X-ray topography
| Autor: | Oriwol, D., Carl, E.-R., Danilewsky, A.N., Sylla, L., Seifert, W., Kittler, M., Leipner, H.S. |
|---|---|
| Zdroj: | In Acta Materialia October 2013 61(18):6903-6910 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect