Application of synchrotron X-ray diffraction and nanoindentation for the determination of residual stress fields around scratches
| Autor: | Khan, M.K., Fitzpatrick, M.E., Hainsworth, S.V., Evans, A.D., Edwards, L. |
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| Zdroj: | In Acta Materialia December 2011 59(20):7508-7520 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect