Coupled electronic and atomic effects on defect evolution in silicon carbide under ion irradiation
| Autor: | Zhang, Yanwen, Xue, Haizhou, Zarkadoula, Eva, Sachan, Ritesh, Ostrouchov, Christopher, Liu, Peng, Wang, Xue-lin, Zhang, Shuo, Wang, Tie Shan, Weber, William J. |
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| Zdroj: | In Current Opinion in Solid State & Materials Science December 2017 21(6):285-298 |
| Databáze: | ScienceDirect |
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