Investigation of cracking in monocrystalline silicon induced by high- temperature indentation
| Autor: | Zhao, Zerui, Zhou, Shuilong, Li, Xianke, Zhu, Bo, Guan, Shanyue, Wang, Shunbo, Zhao, Hongwei |
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| Zdroj: | In Engineering Failure Analysis May 2024 159 |
| Databáze: | ScienceDirect |
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