On the defect detection limits of flash thermography in reflection mode: A comprehensive parametric 3D FE study
| Autor: | Poelman, Gaétan, Hedayatrasa, Saeid, Van Paepegem, Wim, Kersemans, Mathias |
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| Zdroj: | In Infrared Physics and Technology May 2024 138 |
| Databáze: | ScienceDirect |
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