Comparing the efficiency of defect depth characterization algorithms in the inspection of CFRP by using one-sided pulsed thermal NDT
| Autor: | Moskovchenko, A.I., Vavilov, V.P., Chulkov, A.O. |
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| Zdroj: | In Infrared Physics and Technology June 2020 107 |
| Databáze: | ScienceDirect |
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