The influence of Si on the properties of MOVPE grown GaN thin films: Optical and EPR study
| Autor: | Buryi, M., Babin, V., Hubáček, T., Jarý, V., Hájek, F., Kuldová, K., Artemenko, A., Hospodková, A. |
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| Zdroj: | In Radiation Measurements September 2022 157 |
| Databáze: | ScienceDirect |
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