Chapter 12 Aberration-Corrected Electron Microscopes at Brookhaven Microscopes at Brookhaven National Laboratory
Autor: | Zhu, Yimei, Wall, Joe |
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Zdroj: | In Advances in Imaging and Electron Physics 2008 153:481-523 |
Databáze: | ScienceDirect |
Externí odkaz: |
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