Interface failure analysis of embedded NiTi SMA wires using in situ high-resolution X-ray synchrotron tomography

Autor:	Jungbluth, Julia, Bruns, Stefan, Schmidt, Catarina, Beckmann, Felix, Moosmann, Julian, Gapeeva, Anna, Carstensen, Jürgen, Adelung, Rainer, Zeller-Plumhoff, Berit, Gurka, Martin
Zdroj:	In Materials Characterization November 2023 205
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect