An in-situ TEM characterization of electron beam induced dislocation motion in a single-crystalline gold thin film

Autor: Xu, Chi, Han, Wentuo, Xue, Wenbin, Li, Yongliang, Li, Song, Li, Bingsheng, Wan, Farong
Zdroj: In Materials Characterization February 2022 184
Databáze: ScienceDirect