An in-situ TEM characterization of electron beam induced dislocation motion in a single-crystalline gold thin film
Autor: | Xu, Chi, Han, Wentuo, Xue, Wenbin, Li, Yongliang, Li, Song, Li, Bingsheng, Wan, Farong |
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Zdroj: | In Materials Characterization February 2022 184 |
Databáze: | ScienceDirect |
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