Three dimensional microstructural characterization of nanoscale precipitates in AA7075-T651 by focused ion beam (FIB) tomography
| Autor: | Singh, Sudhanshu S., Loza, Jose J., Merkle, Arno P., Chawla, Nikhilesh |
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| Zdroj: | In Materials Characterization August 2016 118:102-111 |
| Databáze: | ScienceDirect |
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