Spectroscopic ellipsometry (SE) studies on vacuum-evaporated ZnSe thin films
| Autor: | Venkatachalam, S., Soundararajan, D., Peranantham, P., Mangalaraj, D., Narayandass, Sa.K., Velumani, S., Schabes-Retchkiman, P. |
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| Zdroj: | In Materials Characterization 2007 58(8):715-720 |
| Databáze: | ScienceDirect |
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