Influence of the Organic Layer Thickness in (Metal-Assisted) Secondary Ion Mass Spectrometry Using Ga + and C 60+ Projectiles
| Autor: | Wehbe, Nimer, Mouhib, Taoufiq, Prabhakaran, Aneesh, Bertrand, Patrick, Delcorte, Arnaud |
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| Zdroj: | In Journal of the American Society for Mass Spectrometry 2009 20(12):2294-2303 |
| Databáze: | ScienceDirect |
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