Top gate engineering of field-effect transistors based on wafer-scale two-dimensional semiconductors
Autor: | Ma, Jingyi, Chen, Xinyu, Sheng, Yaochen, Tong, Ling, Guo, Xiaojiao, Zhang, Minxing, Luo, Chen, Zong, Lingyi, Xia, Yin, Sheng, Chuming, Wang, Yin, Gou, Saifei, Wang, Xinyu, Wu, Xing, Zhou, Peng, Zhang, David Wei, Wu, Chenjian, Bao, Wenzhong |
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Zdroj: | In Journal of Materials Science & Technology 20 April 2022 106:243-248 |
Databáze: | ScienceDirect |
Externí odkaz: |