X-ray diffraction analysis of cold-worked Cu-Ni-Si and Cu-Ni-Si-Cr alloys by Rietveld method
Autor: | KHEREDDINE, A., LARBI, F. HADJ, DJEBALA, L., AZZEDDINE, H., ALILI, B., BRADAI, D. |
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Zdroj: | In Transactions of Nonferrous Metals Society of China 2011 21(3):482-487 |
Databáze: | ScienceDirect |
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