X-ray diffraction analysis of cold-worked Cu-Ni-Si and Cu-Ni-Si-Cr alloys by Rietveld method

Autor: KHEREDDINE, A., LARBI, F. HADJ, DJEBALA, L., AZZEDDINE, H., ALILI, B., BRADAI, D.
Zdroj: In Transactions of Nonferrous Metals Society of China 2011 21(3):482-487
Databáze: ScienceDirect