Study of structural changes caused by nanosecond laser annealing of Ge- and Sn-implanted Si crystal

Autor: Klinger, D., Żymierska, D., Minikayev, R., Nowakowska-Langier, K., Pelka, J.B., Nowicki, L., Kozankiewicz, B., Caliebe, W.
Zdroj: In Radiation Physics and Chemistry 2011 80(10):1064-1067
Databáze: ScienceDirect