Depth-selective 2D-ACAR studies on low- k dielectric thin films
| Autor: | Eijt, S.W.H. *, van Veen, A., Falub, C.V., Galindo, R.Escobar, Schut, H., Mijnarends, P.E., de Theije, F.K., Balkenende, A.R. |
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| Zdroj: | In Radiation Physics and Chemistry 2003 68(3):357-362 |
| Databáze: | ScienceDirect |
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