Understanding STM images and EELS spectra of oxides with strongly correlated electrons: a comparison of nickel and uranium oxides

Autor: Dudarev, S.L. *, Castell, M.R., Botton, G.A., Savrasov, S.Y., Muggelberg, C., Briggs, G.A.D., Sutton, A.P., Goddard, D.T.
Zdroj: In Micron 2000 31(4):363-372
Databáze: ScienceDirect