Understanding STM images and EELS spectra of oxides with strongly correlated electrons: a comparison of nickel and uranium oxides
Autor: | Dudarev, S.L. *, Castell, M.R., Botton, G.A., Savrasov, S.Y., Muggelberg, C., Briggs, G.A.D., Sutton, A.P., Goddard, D.T. |
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Zdroj: | In Micron 2000 31(4):363-372 |
Databáze: | ScienceDirect |
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