Defects caused by high-energy ion beams, as measured by scanning probe methods
| Autor: | Biró, L.P *, Gyulai, J, Márk, G.I, Daróczi, Cs.S |
|---|---|
| Zdroj: | In Micron 1999 30(3):245-254 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Biró, L.P *, Gyulai, J, Márk, G.I, Daróczi, Cs.S |
|---|---|
| Zdroj: | In Micron 1999 30(3):245-254 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect