Characterization of extended defects in 2D materials using aperture-based dark-field STEM in SEM

Autor:	Denninger, Peter, Schweizer, Peter, Spiecker, Erdmann
Zdroj:	In Micron November 2024 186
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect