Comparing three quantification methods on N/Si ratio analysis using electron energy loss spectroscopy (EELS)
| Autor: | Rui, Xue, Wang, Yun-Yu, Wang, Shixin, Chan, Sook Fun, Jin, Qiang |
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| Zdroj: | In Micron June 2022 157 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect