Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy
| Autor: | Wielgoszewski, Grzegorz, Pałetko, Piotr, Tomaszewski, Daniel, Zaborowski, Michał, Jóźwiak, Grzegorz, Kopiec, Daniel, Gotszalk, Teodor, Grabiec, Piotr |
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| Zdroj: | In Micron December 2015 79:93-100 |
| Databáze: | ScienceDirect |
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