Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy
| Autor: | Robb, Paul D., Finnie, Michael, Craven, Alan J. |
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| Zdroj: | In Micron October 2012 43(10):1068-1072 |
| Databáze: | ScienceDirect |
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