Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope

Autor: LaGrange, Thomas, Reed, Bryan W., Santala, Melissa K., McKeown, Joseph T., Kulovits, Andreas, Wiezorek, Jörg M.K., Nikolova, Liliya, Rosei, Federico, Siwick, Bradely J., Campbell, Geoffrey H.
Zdroj: In Micron November 2012 43(11):1108-1120
Databáze: ScienceDirect