Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction method
| Autor: | Wzorek, M., Czerwinski, A., Ratajczak, J., Dylewicz, R., Kątcki, J. |
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| Zdroj: | In Micron 2009 40(1):37-40 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect