High-resolution transmission electron microscopy of phase formation and growth in metal–Si–Ge systems
Autor: | Chen, L.J., Lai, J.B., Lee, C.S. |
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Zdroj: | In Micron 2002 33(6):535-541 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Chen, L.J., Lai, J.B., Lee, C.S. |
---|---|
Zdroj: | In Micron 2002 33(6):535-541 |
Databáze: | ScienceDirect |
Externí odkaz: |