Measurements of electron beam damage for organic crystals in a high voltage electron microscope with image plates

Autor:	Ohno, Tamotsu *, Sengoku, Masaya, Arii, Tatsuo
Zdroj:	In Micron 2002 33(4):403-406
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect