System identification-based frequency domain feature extraction for defect detection and characterization

Autor: Li, Ping, Lang, Zi–Qiang, Zhao, Ling, Tian, GuiYun, Neasham, Jeffrey A., Zhang, Jun, Graham, David J.
Zdroj: In NDT and E International September 2018 98:70-79
Databáze: ScienceDirect