Research on edge identification of a defect using pulsed eddy current based on principal component analysis
Autor: | BinFeng, Yang, FeiLu, Luo, Dan, Han |
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Zdroj: | In NDT and E International 2007 40(4):294-299 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | BinFeng, Yang, FeiLu, Luo, Dan, Han |
---|---|
Zdroj: | In NDT and E International 2007 40(4):294-299 |
Databáze: | ScienceDirect |
Externí odkaz: |