Grain boundary control for high-reliability HfO2-based RRAM

Autor: Jeong, Dong Geun, Park, Eunpyo, Jo, Yooyeon, Yang, Eunyeong, Noh, Gichang, Lee, Dae Kyu, Kim, Min Jee, Jeong, YeonJoo, Jang, Hyun Jae, Joe, Daniel J., Chang, Jiwon, Kwak, Joon Young
Zdroj: In Chaos, Solitons and Fractals: the interdisciplinary journal of Nonlinear Science, and Nonequilibrium and Complex Phenomena June 2024 183
Databáze: ScienceDirect