Grain boundary control for high-reliability HfO2-based RRAM
Autor: | Jeong, Dong Geun, Park, Eunpyo, Jo, Yooyeon, Yang, Eunyeong, Noh, Gichang, Lee, Dae Kyu, Kim, Min Jee, Jeong, YeonJoo, Jang, Hyun Jae, Joe, Daniel J., Chang, Jiwon, Kwak, Joon Young |
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Zdroj: | In Chaos, Solitons and Fractals: the interdisciplinary journal of Nonlinear Science, and Nonequilibrium and Complex Phenomena June 2024 183 |
Databáze: | ScienceDirect |
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