Assessment of the complete chain evolution process of LIBs from micro internal short circuit failure to thermal runaway under mechanical abuse conditions
| Autor: | Li, Yuxuan, Zhang, Ningjie, Jiang, Lihua, Wei, Zesen, Zhang, Yue, Yu, Yin, Song, Laifeng, Wang, Linjun, Duan, Qiangling, Sun, Jinhua, Wang, Qingsong |
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| Zdroj: | In Process Safety and Environmental Protection May 2024 185:296-306 |
| Databáze: | ScienceDirect |
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