Multi-scale GAN with transformer for surface defect inspection of IC metal packages
| Autor: | Chen, Kaiqiong, Cai, Nian, Wu, Zhenshuang, Xia, Hao, Zhou, Shuai, Wang, Han |
|---|---|
| Zdroj: | In Expert Systems With Applications February 2023 212 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect