Exploiting intra-day patterns for market shock prediction: A machine learning approach
Autor: | Sun, Jinwen, Xiao, Keli, Liu, Chuanren, Zhou, Wenjun, Xiong, Hui |
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Zdroj: | In Expert Systems With Applications 1 August 2019 127:272-281 |
Databáze: | ScienceDirect |
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