Stitching defect detection and classification using wavelet transform and BP neural network
| Autor: | Wong, W.K., Yuen, C.W.M., Fan, D.D., Chan, L.K., Fung, E.H.K. |
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| Zdroj: | In Expert Systems With Applications 2009 36(2) Part 2:3845-3856 |
| Databáze: | ScienceDirect |
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