Accelerated degradation testing for lifetime analysis considering random effects and the influence of stress and measurement errors
Autor: | Li, Yang, Gao, Haifeng, Chen, Hongtian, Liu, Chun, Yang, Zhe, Zio, Enrico |
---|---|
Zdroj: | In Reliability Engineering and System Safety July 2024 247 |
Databáze: | ScienceDirect |
Externí odkaz: |