Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions
| Autor: | Ling, M.H., Hu, X.W. |
|---|---|
| Zdroj: | In Reliability Engineering and System Safety January 2020 193 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Ling, M.H., Hu, X.W. |
|---|---|
| Zdroj: | In Reliability Engineering and System Safety January 2020 193 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect