Gamma processes and peaks-over-threshold distributions for time-dependent reliability
Autor: | van Noortwijk, J.M., van der Weide, J.A.M., Kallen, M.J., Pandey, M.D. |
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Zdroj: | In Reliability Engineering and System Safety 2007 92(12):1651-1658 |
Databáze: | ScienceDirect |
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