A fully automatic adjacent key-points localization framework for minimal repeated pattern detection in printed fabric images

Autor: Zang, Qiyan, Zhang, Jian, Bo, Liling, Xiao, Yuchen, Gao, Guangwei, Zhang, Heng, Li, Hongran, Zhong, Zhaoman, Ren, Yan
Zdroj: In Knowledge-Based Systems 27 September 2024 300
Databáze: ScienceDirect