Advanced uncertainty based approach for discovering erasable product patterns
| Autor: | Lee, Chanhee, Baek, Yoonji, Lin, Jerry Chun-Wei, Truong, Tin, Yun, Unil |
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| Zdroj: | In Knowledge-Based Systems 6 April 2022 241 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Lee, Chanhee, Baek, Yoonji, Lin, Jerry Chun-Wei, Truong, Tin, Yun, Unil |
|---|---|
| Zdroj: | In Knowledge-Based Systems 6 April 2022 241 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect