Complementarity of capacitance transient spectroscopy and drain current transient spectroscopy to detect traps in HEMTs
Autor: | Dermoul, I, Chekir, F, Ben Salem, M, Maaref, H * |
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Zdroj: | In Materials Science & Engineering C 2002 21(1):241-244 |
Databáze: | ScienceDirect |
Externí odkaz: |