The use of atomic force microscopy to quantify membrane surface electrical properties
Autor: | Bowen, W.Richard *, Doneva, Teodora A, Stoton, J.Austin G |
---|---|
Zdroj: | In Colloids and Surfaces A: Physicochemical and Engineering Aspects 2002 201(1):73-83 |
Databáze: | ScienceDirect |
Externí odkaz: |